Metrology
A crucial part of any optical thin film deposition technique is post processing analysis to ensure that the required film has been deposited correctly. Helia employs optical analysis hardware and software coupled with extensive engineering knowledge and experience to accurately measure thin film coatings.
Spectral reflectance and transmission characteristics of all our thin film depositions are analysed using state-of-the-art hardware and software techniques. Back modelling using industry standard Essential Macleod software ensures that the optical designs created by our engineers are re-created in reality.
Helia employs a range of instruments:
- spectrophotometer for accurate reflection & transmission measurements
- spot spectrophotometer for analysing the spatial performance of the coatings
- Fourier-transform infrared spectrophotometer (FTIR) for measuring the performance coatings from near to far-IR wavelengths
FOLLOW US
