Electro-Optic Test (Laser Bar Test)
Helia’s proprietary HELTEST system automates the electro-optical characterization of unmounted laser diode bars and chips. Typical measurements include LIV/PIV, spectral characterization and topside micrographs
The HELTEST platform is an expandable and customisable platform to automatically perform a varied range of sequential measurements. Devices under test (DUT) are held on a high-precision motorised vacuum chuck accepting multiple bars simultaneously for higher throughput. The testing process is carried out with semi- or full autonomy beneath a digital microscope and includes automatic contact detection, optical fibre alignment, invalid data detection, etc. Our control software is highly customisable, enabling test protocols matched to your needs with full chip traceability.
- LIV, PIV, and spectral measurements with data accessible via FTP
- Fully- / semi-automated device testing with parameter extraction, proprietary HELTEST software
- Modular system customizable to your specific needs (probe type, test protocols, analysis, integration of external algorithms)
- Capable of top-side visual inspection
- Highly controlled test environment: cleanroom class 10000, vibration-isolated, laser safety design up to IEC 60825 class 4
- Temperature-controlled vacuum-chuck with ultra-low profile allowing a wide range of devices and detectors
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